### PROCEEDINGS VOLUME 3426

Scattering and Surface Roughness II*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 3426

Date Published: 30 October 1998

Date Published: 30 October 1998

Table of Contents

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Design and synthesis of random uniform diffusers

Author(s): Eugenio R. Mendez; Gabriel C. Martinez-Niconoff; Alexei A. Maradudin; Tamara A. Leskova

Author(s): Eugenio R. Mendez; Gabriel C. Martinez-Niconoff; Alexei A. Maradudin; Tamara A. Leskova

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Spectral changes of light scattered from a random metal suface in the Otto attenuated total reflection configuration

Author(s): Tamara A. Leskova; Alexei A. Maradudin; Andrei V. Shchegrov; Eugenio R. Mendez

Author(s): Tamara A. Leskova; Alexei A. Maradudin; Andrei V. Shchegrov; Eugenio R. Mendez

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High-frequency approximations of the full wave solutions to single and double scatter cross sections for two-dimensional random rough surfaces

Author(s): Ezekiel Bahar; Magda El-Shenawee

Author(s): Ezekiel Bahar; Magda El-Shenawee

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Application of MOMI iteration to solve the magnetic and electric field integral equations

Author(s): J. Merle Elson; Phuc G. Tran

Author(s): J. Merle Elson; Phuc G. Tran

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Modified Beckmann-Kirchoff scattering theory for nonparaxial angles

Author(s): Cynthia L. Vernold; James E. Harvey

Author(s): Cynthia L. Vernold; James E. Harvey

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Iterative approach to solving the magnetic and electric field integral equations for scattering by a dielectric thin film

Author(s): J. Merle Elson; Lewis F. DeSandre

Author(s): J. Merle Elson; Lewis F. DeSandre

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Effective mirror constituent of light scattering on a rough surface and light transfer in optical devices

Author(s): Margarita E. Globus; Boris V. Grinyov; Marina A. Ratner

Author(s): Margarita E. Globus; Boris V. Grinyov; Marina A. Ratner

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Experimental studies of scatter-probe near-field optical microscopy

Author(s): Saul Alonso Zavala Ortiz; Pedro Negrete-Regagnon; Eugenio R. Mendez

Author(s): Saul Alonso Zavala Ortiz; Pedro Negrete-Regagnon; Eugenio R. Mendez

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Surface electromagnetic waves in near-field optical scanning microscopy

Author(s): Montserrat Freixa Pascual; Wolfgang Zierau; Tamara A. Leskova; Alexei A. Maradudin

Author(s): Montserrat Freixa Pascual; Wolfgang Zierau; Tamara A. Leskova; Alexei A. Maradudin

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Features in the speckle correlations of light scattered from volume-disordered dielectric media

Author(s): V. Malyshkin; Arthur R. McGurn; Alexei A. Maradudin

Author(s): V. Malyshkin; Arthur R. McGurn; Alexei A. Maradudin

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Analysis of microstructure changes and dynamic processes on rough surfaces using speckle correlation

Author(s): Thomas Fricke-Begemann; Frank Beyrau; Gerd Guelker; Klaus D. Hinsch; Peter Jauschke; Karin Wolff

Author(s): Thomas Fricke-Begemann; Frank Beyrau; Gerd Guelker; Klaus D. Hinsch; Peter Jauschke; Karin Wolff

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Parametric optical surface roughness measurement by means of polychromatic speckle autocorrelation

Author(s): Stefan Patzelt; Andreas Ciossek; Peter Lehmann; Armin Schoene

Author(s): Stefan Patzelt; Andreas Ciossek; Peter Lehmann; Armin Schoene

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Computer simulation studies of the speckle correlations of light scattered from a random array of dielectric spheres

Author(s): Arthur R. McGurn; Alexei A. Maradudin

Author(s): Arthur R. McGurn; Alexei A. Maradudin

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Polarization measurement of the light scattered by dielectric randomly rough isotropic surfaces

Author(s): Elena I. Chaikina; Pedro Negrete-Regagnon; Gabriel C. Martinez-Niconoff; Eugenio R. Mendez

Author(s): Elena I. Chaikina; Pedro Negrete-Regagnon; Gabriel C. Martinez-Niconoff; Eugenio R. Mendez

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Polarization of out-of-plane optical scatter from SiO2 films grown on photolithographically generated microrough silicon

Author(s): Thomas A. Germer; Bradley W. Scheer

Author(s): Thomas A. Germer; Bradley W. Scheer

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Diffuse reflectance of sintered and pressed polytetrafluoroethylene (PTFE)

Author(s): Patricia Yvonne Barnes; Edward A. Early

Author(s): Patricia Yvonne Barnes; Edward A. Early

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Light reflection from a porous surface where the size of the pore is near the wavelength

Author(s): Vladimir Pshenitsin; Vadim Antonov; Alexei L. Diikov

Author(s): Vladimir Pshenitsin; Vadim Antonov; Alexei L. Diikov

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Application of optical scatterometry to microelectronics and flat panel display processing

Author(s): John Robert McNeil; Stephen A. Coulombe; Petre-Catalin Logofatu; Christopher J. Raymond; S. Sohail H. Naqvi; George J. Collins

Author(s): John Robert McNeil; Stephen A. Coulombe; Petre-Catalin Logofatu; Christopher J. Raymond; S. Sohail H. Naqvi; George J. Collins

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NIST virtual/physical random-profile roughness calibration standards

Author(s): Jun-Feng Song; Christopher J. Evans; M. McGlauflin; E. Whitenton; Theodore V. Vorburger; Y. Yuan

Author(s): Jun-Feng Song; Christopher J. Evans; M. McGlauflin; E. Whitenton; Theodore V. Vorburger; Y. Yuan

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Characterization of planarity of polymer thin films on rough surfaces

Author(s): Wen-li Wu; William E. Wallace

Author(s): Wen-li Wu; William E. Wallace

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Roughness evaluation from ultrapure fluid transfer surface materials for microelectronics fabrication

Author(s): Dumitru Gh. Ulieru

Author(s): Dumitru Gh. Ulieru

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Handheld directional reflectometer: an angular imaging device to measure BRDF and HDR in real time

Author(s): Phillip R. Mattison; Mark S. Dombrowski; James M. Lorenz; Keith J. Davis; Harley C. Mann; Philip Johnson; Bryan Foos

Author(s): Phillip R. Mattison; Mark S. Dombrowski; James M. Lorenz; Keith J. Davis; Harley C. Mann; Philip Johnson; Bryan Foos

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Evaluation of in-situ ARS sensors for characterizing smooth and rough surfaces

Author(s): Andre Kasper; Hendrik Rothe

Author(s): Andre Kasper; Hendrik Rothe

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Novel statistical calibration method for laser scanners

Author(s): Jerry Xiaoming Chen; Yung-Tsai Chris Yen

Author(s): Jerry Xiaoming Chen; Yung-Tsai Chris Yen

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Optical design of the INTEGRAL Optical Monitoring Camera

Author(s): Emmanuel Mazy; Jean-Marc Defise; J.-Y. Plesseria; Lieve de Vos

Author(s): Emmanuel Mazy; Jean-Marc Defise; J.-Y. Plesseria; Lieve de Vos

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Globally accessible bidirectional scattering distribution function software data tool

Author(s): Susan H. C. P. McCall; Robert P. Breault; Rorik A. Henrikson; Michael A. Reid; Anthony J. Clark; Robyn A. Ellis; Alice E. Piotrowski; Lorraine A. Piotrowski; John W. Rodney; Marshall L. McCall

Author(s): Susan H. C. P. McCall; Robert P. Breault; Rorik A. Henrikson; Michael A. Reid; Anthony J. Clark; Robyn A. Ellis; Alice E. Piotrowski; Lorraine A. Piotrowski; John W. Rodney; Marshall L. McCall

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Modeling the affect of multiple beam clipping in FIR and submillimeter instrumentation: ISO-LWS and FIRST-SPIRE

Author(s): Martin E. Caldwell; Bruce Miles Swinyard; Peter F. Gray

Author(s): Martin E. Caldwell; Bruce Miles Swinyard; Peter F. Gray

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Modifying the Harvey-Shack surface scatter theory

Author(s): James E. Harvey; Cynthia L. Vernold

Author(s): James E. Harvey; Cynthia L. Vernold

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Common-path heterodyne interferometer with automatic focusing system for online surface profiling

Author(s): Rong Liang; Dacheng Li; Mang Cao; Hongzhi Zhao; Yong-jun Wu

Author(s): Rong Liang; Dacheng Li; Mang Cao; Hongzhi Zhao; Yong-jun Wu

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Computation of the intensity distribution for a film on a GRIN substrate

Author(s): Mario Marcelo Lehman; Mario Garavaglia

Author(s): Mario Marcelo Lehman; Mario Garavaglia

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Scatterometer at Korea Research Institute of Standards and Science (KRISS) for bidirectional reflectance distribution function (BRDF)

Author(s): Byong Chon Park; Yun Woo Lee; Beomhoan O

Author(s): Byong Chon Park; Yun Woo Lee; Beomhoan O

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BRDF measurements of a new IR black coating with lower reflectance

Author(s): Sheldon M. Smith; John C. Fleming

Author(s): Sheldon M. Smith; John C. Fleming

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Comparison of PSD measurements using stray light sensors with PSD curves evaluated from topography of large AFM scans

Author(s): Dorothee Hueser; Thomas Rinder; Hendrik Rothe

Author(s): Dorothee Hueser; Thomas Rinder; Hendrik Rothe

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INTEGRAL's Optical Monitoring Camera stray-light design

Author(s): Emmanuel Mazy; Jean-Marc Defise; J.-Y. Plesseria

Author(s): Emmanuel Mazy; Jean-Marc Defise; J.-Y. Plesseria

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